Abstract

Frequency-selective measurement of microwave signal parameters based on application of gyromagnetic converters has proven advantageous for the research of microwave radiation over a wide spectrum (several octaves) in multisignal regime in microwave path and for the solution of a number of electromagnetic compatibility (EMC) problems. The measurement frequency band can be enlarged to millimeter-waves with application of monocrystal hexagonal ferrite resonators (HFR) having high internal magnetic fields. Millimeter-wave field interactions with the HFR having alternating resonance frequency are analyzed. This is useful for millimeter-wave signal modulation and demodulation. The analysis is based on the solution of magnetization vector motion equation of the uniaxial spherical HFR with time-varying bias magnetic field or angle of the HFR orientation (for modulation problem) and with amplitude-modulated microwave signal action (for demodulation problem). The novel principle of the HFR frequency-selective measuring system based on automodulation design is discussed

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

EMC Problems; FM; Alternating Resonance Frequency; Amplitude Modulation; Amplitude-Modulated Microwave Signal; Automodulation Design; Demodulation; Electromagnetic Compatibility; Ferrite Devices; Ferromagnetic Resonance; Frequency Modulation; Frequency-Selective Measurement; Frequency-Selective Measuring System; Gyromagnetic Converters; Magnetic Microwave Devices; Magnetization Vector Motion Equation; Measurement Frequency Band; Measurement Systems; Microwave Measurement; Microwave Path; Microwave Power Measurement; Microwave Radiation; Microwave Signal Parameters; Millimeter-Wave Signal Demodulation; Millimeter-Wave Signal Modulation; Monocrystal Hexagonal Ferrite Resonators; Power Measurement; Resonators; Time-Varying Bias Magnetic Field

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 1999 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jan 1999

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