An integrated circuit reliability model and its applicability towards improving programmable logic device reliability
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
University of Missouri--Rolla
xiii, 205 pages
© 1992 James Louis Paunicka, All rights reserved.
Dissertation - Citation
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b2497804~S5
Paunicka, James Louis, "An integrated circuit reliability model and its applicability towards improving programmable logic device reliability" (1992). Doctoral Dissertations. 885.
Share My Dissertation If you are the author of this work and would like to grant permission to make it openly accessible to all, please click the button above.