Doctoral Dissertations

Keywords and Phrases

Electromagnetic Compatibility; Electromagnetic Interference

Abstract

Radio frequency (RF) desensitization issues comprise two components: noise radiation sources and the transfer function from noise sources to the victim antenna. RFI is a critical challenge in modern electronic systems, particularly in densely packed environments. This work presents a comprehensive study of RFI, addressing key aspects through three novel contributions. First, a transfer function measurement method is developed for compact metallic enclosures. This method provides a precise characterization of the electromagnetic (EM) environment within confined spaces, enabling accurate identification of interference pathways. Second, an EM emission management analysis framework is proposed, leveraging transfer functions to quantify and mitigate interference effects. This approach facilitates targeted design improvements for enhancing electromagnetic compatibility (EMC). Finally, a near-field-based equivalent noise source reconstruction technique is introduced for simulating RF desensitization effects. By employing the Huygens’ box principle, this method reconstructs equivalent noise sources to predict system-level RF performance and guide mitigation strategies effectively. Together, these contributions form an integrated methodology for understanding, analyzing, and mitigating RFI, offering practical solutions for real-world electromagnetic compatibility challenges.

Advisor(s)

Hwang, Chulsoon

Committee Member(s)

Dagli, Cihan H., 1949-
Beetner, Daryl G.
Kim, DongHyun (Bill)
Fan, Jun, 1971-

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Summer 2025

Journal article titles appearing in thesis/dissertation

Paper I, found on pages 7–33, has been published in IEEE Transactions on Electromagnetic Compatibility.
Paper II, found on pages 34–63, has been submitted to IEEE Transactions on Electromagnetic Compatibility.
Paper III, found on pages 64–76, has been submitted to IEEE Letters on Electromagnetic Compatibility Practice and Applications.

Pagination

xii, 79 pages

Rights

© 2025 Xiangrui Su , All Rights Reserved

Document Type

Dissertation - Open Access

File Type

text

Language

English

Thesis Number

T 12522

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