Doctoral Dissertations

Keywords and Phrases

Bit error rate eye contour; Floquet; Inhomogeneous media; NEXT; Statistical eye diagram


"In Section 1, the focus is on alleviating the modeling challenges by breaking the overall geometry into small, unique sections and using either a Full-Wave or fast equivalent per-unit-length (Eq. PUL) resistance, inductance, conductance, capacitance (RLGC) method or a partial element equivalent circuit (PEEC) for the broadside coupled traces that cross at an angle. The simulation challenge is resolved by seamlessly integrating the models into a statistical simulation tool that is able to quantify the eye opening at BERs that would help electrical designers in locating crosstalk sensitive regions in the high speed backplane channel designs.

Section 2 investigates the FEXT crosstalk impact on eye opening at a specified bit error rate (BER) at different signal speeds for broadside and edge side differential coupled traces in inhomogeneous media and compared the results against homogeneous media models. A set of design guidelines regarding the material, coupled length and stackup parameter selection is formulated for designers based on the signaling speeds.

The major objective of the study in Section 3 is to determine quantitatively the effect of crosstalk due to periodic broadside coupled routing. Another objective is to help designers figure out the “dos” and “don’ts” of broadside coupled routing for higher signaling rates.

A new methodology is proposed in Section 4 to generate BER contours that capture the Tx driver jitter and ISI through the channel accurately using unique waveforms created from truth table bit combinations. It utilizes 2N short N bit patterns as waveforms and jitter correlation from current bit pattern into adjacent bit patterns to get equivalent transient simulation of a very large bit pattern."--Abstract, page iii.


Fan, Jun, 1971-

Committee Member(s)

Drewniak, James L.
Beetner, Daryl G.
DuBroff, Richard E.
Mutnury, Bhyrav


Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering


Missouri University of Science and Technology

Publication Date

Fall 2014


xiii, 142 pages

Note about bibliography

Includes bibliographical references (pages 135-141).


© 2014 Arun Reddy Chada, All rights reserved.

Document Type

Dissertation - Open Access

File Type




Subject Headings

Printed circuits -- Design and construction
Electronic circuits -- Noise
Signal integrity (Electronics)

Thesis Number

T 10604

Electronic OCLC #