Imaging Ultrathin Al₂O₃ Films with Scanning Tunneling Microscopy

Author

Xiaofeng Lai
Charles C. Chusuei, Missouri University of Science and TechnologyFollow
Kai Luo
Qinlin Guo
D. W. Goodman

Abstract

Reproducible scanning tunneling microscopic (STM) images were obtained from ultrathin Al2O3 films epitaxially grown on Re(0001). Initially, the oxide films grow two-dimensionally in a layer-by-layer fashion with well-ordered surface morphologies. As the oxide film thickens to ca. 9 monolayer equivalents (MLE), the surface roughens and becomes more disordered yet still exhibits significant long-range, hexagonal periodicity as indicated by low energy electron diffraction (LEED). Because of limited conductivity, films thicker than ca. 9 MLE could not be imaged. © 2000 Elsevier Science B.V.

Recommended Citation

X. Lai et al., "Imaging Ultrathin Al₂O₃ Films with Scanning Tunneling Microscopy," Chemical Physics Letters, Elsevier, Jan 2000.

The definitive version is available at https://doi.org/10.1016/S0009-2614(00)01099-X

Department(s)

Chemistry

International Standard Serial Number (ISSN)

0009-2614

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2000 Elsevier, All rights reserved.

Publication Date

01 Jan 2000