Imaging Ultrathin Al₂O₃ Films with Scanning Tunneling Microscopy
Reproducible scanning tunneling microscopic (STM) images were obtained from ultrathin Al2O3 films epitaxially grown on Re(0001). Initially, the oxide films grow two-dimensionally in a layer-by-layer fashion with well-ordered surface morphologies. As the oxide film thickens to ca. 9 monolayer equivalents (MLE), the surface roughens and becomes more disordered yet still exhibits significant long-range, hexagonal periodicity as indicated by low energy electron diffraction (LEED). Because of limited conductivity, films thicker than ca. 9 MLE could not be imaged. © 2000 Elsevier Science B.V.
X. Lai et al., "Imaging Ultrathin Al₂O₃ Films with Scanning Tunneling Microscopy," Chemical Physics Letters, Elsevier, Jan 2000.
The definitive version is available at https://doi.org/10.1016/S0009-2614(00)01099-X
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© 2000 Elsevier, All rights reserved.
01 Jan 2000