Scanning Tunneling Microscopy of Nanoscale Electrodeposited Superlattices

Author

Jay A. Switzer, Missouri University of Science and TechnologyFollow
Teresa D. Golden

Abstract

Artificially layered superconductor materials based on crystalline multilayer structure are of potential interest due to the unusual quantum effects which could be expected in materials of this type. Scanning tunneling microscopy has recently been used (e.g. see Figure) to measure the modulation wavelength (the bilayer thickness) and to estimate the composition profile in such superlattices.

Recommended Citation

J. A. Switzer and T. D. Golden, "Scanning Tunneling Microscopy of Nanoscale Electrodeposited Superlattices," Advanced Materials, Wiley-VCH Verlag, Jun 1993.

The definitive version is available at https://doi.org/10.1002/adma.19930050615

Department(s)

Chemistry

International Standard Serial Number (ISSN)

0935-9648

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1993 Wiley-VCH Verlag, All rights reserved.

Publication Date

01 Jun 1993