Scanning Tunneling Microscopy of Nanoscale Electrodeposited Superlattices
Artificially layered superconductor materials based on crystalline multilayer structure are of potential interest due to the unusual quantum effects which could be expected in materials of this type. Scanning tunneling microscopy has recently been used (e.g. see Figure) to measure the modulation wavelength (the bilayer thickness) and to estimate the composition profile in such superlattices.
J. A. Switzer and T. D. Golden, "Scanning Tunneling Microscopy of Nanoscale Electrodeposited Superlattices," Advanced Materials, Wiley-VCH Verlag, Jun 1993.
The definitive version is available at https://doi.org/10.1002/adma.19930050615
International Standard Serial Number (ISSN)
Article - Journal
© 1993 Wiley-VCH Verlag, All rights reserved.
01 Jun 1993