Scholars' Mine
Missouri S&T
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Curtis Laws Wilson Library
400 W. 14th Street
Rolla, MO 65409-0060
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| Title: | System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms | |
| Alternate Title: | Correlation between EUT failure levels and ESD generator parameters. Frequency domain measurement method for the analysis of ESD generators and coupling. Non-linear [Greek character for mu]-controller power distribution network model for characterization of immunity to EFTS. | |
| Author (s): | Koo, Ja Yong, 1970- | |
| Advisor(s): | Pommerenke, David | |
| Department/Lab Affiliations: | Electromagnetic Compatibility Laboratory | |
| Issue Date: | 2008 | |
| Publisher: | Missouri University of Science and Technology | |
| Citation: | Koo, Jayong. "System and IC Level Analysis of Electrostatic Discharge (ESD) and Electrical Fast Transient (EFT) Immunity and Associated Coupling Mechanisms." Ph.D. Dissertation, Electrical Engineering, Missouri University of Science and Technology, 2008. | |
| Abstract: | "The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, p. iv. | |
| Type: | Thesis/Dissertation text | |
| Copyright Notice: | These materials are protected under copyright by the original author. | |
| Link to this page: | ||
| URL: | ||
| Full Text: |
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| title | System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms | |
| title.alternative | Correlation between EUT failure levels and ESD generator parameters. | |
| title.alternative | Frequency domain measurement method for the analysis of ESD generators and coupling. | |
| title.alternative | Non-linear [Greek character for mu]-controller power distribution network model for characterization of immunity to EFTS. | |
| contributor.advisor | Pommerenke, David | |
| contributor.author | Koo, Ja Yong, 1970- | |
| contributor.deptlab | Electromagnetic Compatibility Laboratory | |
| subject.LCSH | Electric discharges. | |
| subject.LCSH | Electric power system stability. | |
| subject.LCSH | Electromagnetic compatibility -- Standards. | |
| date.issued | 2008 | |
| publisher | Missouri University of Science and Technology | |
| identifier.URI | ||
| identifier.citation | Koo, Jayong. "System and IC Level Analysis of Electrostatic Discharge (ESD) and Electrical Fast Transient (EFT) Immunity and Associated Coupling Mechanisms." Ph.D. Dissertation, Electrical Engineering, Missouri University of Science and Technology, 2008. | |
| identifier.oclc | 244252067 | |
| description | Vita. | |
| description | The entire thesis text is included in file. | |
| description | Title from title screen of thesis/dissertation PDF file (viewed August 21, 2008) | |
| description | Thesis (Ph. D.)--Missouri University of Science and Technology, 2008. | |
| description | Includes bibliographical references. | |
| description | System requirements: Adobe Acrobat Reader; Internet browser. | |
| description | Mode of access: World Wide Web. | |
| description.abstract | "The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, p. iv. | |
| description. statementOfResponsibility | by Ja Yong Koo. | |
| type | Thesis/Dissertation | |
| type.DCMIType | text | |
| rights | These materials are protected under copyright by the original author. | |
| language.ISO639-2 | eng | |
| format.extent | xiii, 102 p. : ill., digital, PDF file. | |
| date.accessioned | 2008-08-14T14:30:10Z | |
| date.available | 2008-08-21T21:35:06Z | |
| identifier.persist.URI | ||
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