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Title: Defect-tolerance and testing for configurable nano-crossbars
Alternate Title: BIST approach for configurable nanofabric arrays.
Defect tolerance and testing for configurable nano crossbars
Nanofabric PLA architecture with redundancy enhancement.
Author (s): Joshi, Mandar Vijay, 1982-
Advisor(s): Al-Assadi, Waleed K.
Keywords: NanoFabric.
Issue Date: 2008
Publisher: Missouri University of Science and Technology
Citation: Joshi, Mandar. "Defect-Tolerance and Testing for Configurable Nano-Crossbars." Master's Thesis, Computer Engineering, Missouri University of Science and Technology, 2008.
Abstract: "Moore's Law speculated a trend in computation technology in terms of number of transistors per unit area that would double roughly every two years. Even after 40 years of this prediction, current technologies have been following it successfully. There are however, certain physical limitations of current CMOS that would result in fundamental obstructions to continuation of Moore's Law. Although there is a debate amongst experts on how much time it would take for this to happen, it is certain that some entirely new paradigms for semiconductor electronics would be needed to replace CMOS and to delay the end of Moore's Law. Silicon nanowires (SiNW) and Carbon nanotubes (CNT) possess significant promise to replace current CMOS"--Abstract, p. iv.
Type: Thesis/Dissertation
text
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titleDefect-tolerance and testing for configurable nano-crossbars
title.alternativeBIST approach for configurable nanofabric arrays.
title.alternativeDefect tolerance and testing for configurable nano crossbars
title.alternativeNanofabric PLA architecture with redundancy enhancement.
contributor.advisorAl-Assadi, Waleed K.
contributor.authorJoshi, Mandar Vijay, 1982-
subjectNanoFabric.
subject.LCSHFault-tolerant computing.
subject.LCSHIntegrated circuits -- Fault tolerance.
subject.LCSHNanostructured materials.
subject.LCSHNanotechnology.
date.issued2008
publisherMissouri University of Science and Technology
identifier.URI
http://scholarsmine.mst.edu/thesis/pdf/Joshi_09007dcc804bce1c.pdf
identifier.citationJoshi, Mandar. "Defect-Tolerance and Testing for Configurable Nano-Crossbars." Master's Thesis, Computer Engineering, Missouri University of Science and Technology, 2008.
identifier.oclc217308292
descriptionIncludes bibliographical references.
descriptionMode of access: World Wide Web.
descriptionSystem requirements: Adobe Acrobat Reader; Internet browser.
descriptionThe entire thesis text is included in file.
descriptionThesis (M.S.)--Missouri University of Science and Technology, 2008.
descriptionTitle from title screen of thesis/dissertation PDF file (viewed April 2, 2008)
descriptionVita.
description.abstract"Moore's Law speculated a trend in computation technology in terms of number of transistors per unit area that would double roughly every two years. Even after 40 years of this prediction, current technologies have been following it successfully. There are however, certain physical limitations of current CMOS that would result in fundamental obstructions to continuation of Moore's Law. Although there is a debate amongst experts on how much time it would take for this to happen, it is certain that some entirely new paradigms for semiconductor electronics would be needed to replace CMOS and to delay the end of Moore's Law. Silicon nanowires (SiNW) and Carbon nanotubes (CNT) possess significant promise to replace current CMOS"--Abstract, p. iv.
description.
statementOfResponsibility
by Mandar Vijay Joshi.
typeThesis/Dissertation
type.DCMITypetext
format.extentix, 41 p. : ill., digital, PDF file.
language.ISO639-2eng
rightsThese materials are protected under copyright by the original author.
date.accessioned2008-03-17T22:34:14Z
date.available2008-04-02T20:51:30Z
identifier.persist.URI
http://scholarsmine.mst.edu/thesis/Defecttolerance_and_09007dcc804cefad.html
Full Text
Joshi_09007dcc804bce1c.pdf