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| Title: | Susceptibility scanning as failure analysis tool for system-level electrostatic discharge (ESD) problems | |
| Author (s): | Giorgi, Muchaidze Koo, Jayong Cai, Qing Li, Tun Han, Lijun Martwick, Andrew Wang, Kai Min, Jin Drewniak, James L. Pommerenke, David | |
| Department/Lab Affiliations: | Electrical and Computer Engineering Electromagnetic Compatibility Laboratory Materials Research Center Materials Science & Engineering | |
| Keywords: | electrostatic discharges (ESDs) scanning susceptibility | |
| Subject Terms: | Immunity. | |
| Issue Date: | 2008-05 | |
| Publisher: | Institute of Electrical and Electronics Engineers IEEE | |
| Citation: | Muchaidze, Giorgi, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, and David Pommerenke. “Susceptibility scanning as failure analysis tool for system-level electrostatic discharge (ESD) problems”, IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 268-276, 2007. | |
| Abstract: | Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed. | |
| Type: | Article - Journal text | |
| In Title: | IEEE Transactions on Electromagnetic Compatibility | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. allows publisher's final version to be uploaded FULL COPYRIGHT INFORMATION: | |
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| title | Susceptibility scanning as failure analysis tool for system-level electrostatic discharge (ESD) problems | |
| contributor.author | Giorgi, Muchaidze | |
| contributor.author | Koo, Jayong | |
| contributor.author | Cai, Qing | |
| contributor.author | Li, Tun | |
| contributor.author | Han, Lijun | |
| contributor.author | Martwick, Andrew | |
| contributor.author | Wang, Kai | |
| contributor.author | Min, Jin | |
| contributor.author | Drewniak, James L. | |
| contributor.author | Pommerenke, David | |
| contributor.deptlab | Electrical and Computer Engineering | |
| contributor.deptlab | Electromagnetic Compatibility Laboratory | |
| contributor.deptlab | Materials Research Center | |
| contributor.deptlab | Materials Science & Engineering | |
| subject | electrostatic discharges (ESDs) | |
| subject | scanning | |
| subject | susceptibility | |
| subject.LCSH | Immunity. | |
| date.issued | 2008-05 | |
| publisher | Institute of Electrical and Electronics Engineers IEEE | |
| identifier.citation | Muchaidze, Giorgi, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, and David Pommerenke. “Susceptibility scanning as failure analysis tool for system-level electrostatic discharge (ESD) problems”, IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 268-276, 2007. | |
| identifier.pub.URI | ||
| description.abstract | Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed. | |
| type | Article - Journal | |
| type.DCMIType | text | |
| type.status | Final version | |
| relation.isPartOf | IEEE Transactions on Electromagnetic Compatibility | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights | allows publisher's final version to be uploaded | |
| rights.URI | ||
| rights.URI | ||
| rights.URI | ||
| date.accessioned | 2008-06-25T21:31:50Z | |
| date.available | 2008-06-30T21:12:22Z | |
| identifier.persist.URI | ||
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