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Title: Experimental investigation of the ESD sensitivity of an 8-bit microcontroller
Author (s): Beetner, Daryl G.
Carlton, Ross
Han, Lijun
Koo, Ja Yong
Pommerenke, David
Department/Lab Affiliations: Electrical and Computer Engineering
Electromagnetic Compatibility Laboratory
Keywords: electrostatic discharge
sensitivity
Subject Terms: Electric discharges.
Microcontrollers.
Issue Date: 2007
Publisher: Institute of Electrical and Electronics Engineers IEEE
Citation: Han, Lijun, Jayong Koo, David Pommerenke, Daryl Beetner, and Ross Carlton. "Experimental Investigation of the ESD Sensitivity of an 8-Bit Microcontroller." International Symposium on Electromagnetic Compatibility, 2007.
Abstract: In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.
Type: Article
text
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Publisher URL:
http://dx.doi.org/10.1109/ISEMC.2007.173
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Full Text:
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titleExperimental investigation of the ESD sensitivity of an 8-bit microcontroller
contributor.authorBeetner, Daryl G.
contributor.authorCarlton, Ross
contributor.authorHan, Lijun
contributor.authorKoo, Ja Yong
contributor.authorPommerenke, David
contributor.deptlabElectrical and Computer Engineering
contributor.deptlabElectromagnetic Compatibility Laboratory
subjectelectrostatic discharge
subjectsensitivity
subject.LCSHElectric discharges.
subject.LCSHMicrocontrollers.
date.issued2007
publisherInstitute of Electrical and Electronics Engineers IEEE
identifier.citationHan, Lijun, Jayong Koo, David Pommerenke, Daryl Beetner, and Ross Carlton. "Experimental Investigation of the ESD Sensitivity of an 8-Bit Microcontroller." International Symposium on Electromagnetic Compatibility, 2007.
identifier.pub.URI
http://dx.doi.org/10.1109/ISEMC.2007.173
description.abstractIn this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.
typeArticle
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rightsallows publisher's final version to be uploaded
rights.URI
http://www.ieee.org/portal/cms_docs_iportals/iportals/publications/rights/downloads/IEEECForm121302pdf.pdf
rights.URI
http://www.ieee.org/web/publications/rights/index.html
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2008-07-08T18:00:49Z
date.available2008-07-14T15:56:07Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/ExperimentalInvestigationOfTheESDSensitivityOf_09007dcc8052feb6.html
Full Text
043_09007dcc8052ff90.pdf