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| Title: | Correlation between EUT failure levels and ESD generator parameters | |
| Author (s): | Koo, Jayong Cai, Qing Wang, Kai Maas, J. Takahashi, T. Martwick, A. Pommerenke, David | |
| Department/Lab Affiliations: | Center for Aerospace Manufacturing Technologies Electrical and Computer Engineering Electromagnetic Compatibility Laboratory | |
| Keywords: | electronic equipment testing electrostatic discharge | |
| Issue Date: | 2008-11 | |
| Publisher: | Institute of Electrical and Electronics Engineers IEEE | |
| Citation: | Koo, Jayong, Q. Cai, K. Wang, J. Maas, T. Takahashi , A. Martwick, D. Pommerenke. "Correlation between EUT failure levels and ESD generator parameters." IEEE Transactions on Electromagnetic Compatibility, vol.50, no.4, Nov. 2008, 794-801 | |
| Abstract: | Some system-level electrostatic discharge (ESD) tests repeat badly if different ESD generators are used. For improving repeatability, ESD generator specifications have been changed, and modified generators have been compared in a worldwide round robin test. The test showed up to 1 : 3 variations of failure levels. Multiple parameters that characterize ESD generators have been measured. This paper correlates the parameters to test result variations trying to distinguish between important and nonrelevant parameters. The transient fields show large variations among different ESD generators. A correlation has been observed in many equipment under tests (EUTs) between failure levels and the spectral content of the voltage induced in a semicircular loop. EUT resonance enhances the field coupling, and is the dominate failure mechanism. The regulation on the transient field is expected to improve the test repeatability. | |
| Type: | Article - Conference proceedings text | |
| In Title: | Transactions on Electromagnetic Compatibility | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. can upload final version FULL COPYRIGHT INFORMATION: | |
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| title | Correlation between EUT failure levels and ESD generator parameters | |
| contributor.author | Koo, Jayong | |
| contributor.author | Cai, Qing | |
| contributor.author | Wang, Kai | |
| contributor.author | Maas, J. | |
| contributor.author | Takahashi, T. | |
| contributor.author | Martwick, A. | |
| contributor.author | Pommerenke, David | |
| contributor.deptlab | Center for Aerospace Manufacturing Technologies | |
| contributor.deptlab | Electrical and Computer Engineering | |
| contributor.deptlab | Electromagnetic Compatibility Laboratory | |
| subject | electronic equipment testing | |
| subject | electrostatic discharge | |
| date.issued | 2008-11 | |
| publisher | Institute of Electrical and Electronics Engineers IEEE | |
| identifier.citation | Koo, Jayong, Q. Cai, K. Wang, J. Maas, T. Takahashi , A. Martwick, D. Pommerenke. "Correlation between EUT failure levels and ESD generator parameters." IEEE Transactions on Electromagnetic Compatibility, vol.50, no.4, Nov. 2008, 794-801 | |
| identifier.pub.URI | ||
| description.abstract | Some system-level electrostatic discharge (ESD) tests repeat badly if different ESD generators are used. For improving repeatability, ESD generator specifications have been changed, and modified generators have been compared in a worldwide round robin test. The test showed up to 1 : 3 variations of failure levels. Multiple parameters that characterize ESD generators have been measured. This paper correlates the parameters to test result variations trying to distinguish between important and nonrelevant parameters. The transient fields show large variations among different ESD generators. A correlation has been observed in many equipment under tests (EUTs) between failure levels and the spectral content of the voltage induced in a semicircular loop. EUT resonance enhances the field coupling, and is the dominate failure mechanism. The regulation on the transient field is expected to improve the test repeatability. | |
| type | Article - Conference proceedings | |
| type.DCMIType | text | |
| type.status | Final version | |
| relation.isPartOf | Transactions on Electromagnetic Compatibility | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights | can upload final version | |
| rights.URI | ||
| rights.URI | ||
| rights.URI | ||
| date.accessioned | 2009-01-14T22:56:56Z | |
| date.available | 2009-01-22T14:49:44Z | |
| identifier.persist.URI | ||
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