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Title: Cause and effects of voltage collapse - case studies with dynamic simulations
Author (s): Dong, Feng
Crow, Mariesa L.
Chowdhury, Badrul H.
Acar, Levent
Department/Lab Affiliations: Electrical and Computer Engineering
Energy Research and Development Center
Intelligent Systems Center
Power Systems Laboratory
Keywords: load tap changer
over excitation limiter
preventive control
reactive power margin
stability margin
Issue Date: 2005
Publisher: Institute of Electrical and Electronics Engineers IEEE
Citation: Dong, Feng, Badrul H. Chowdhury, Mariesa L. Crow, and Levent Acar. "Cause and Effects of Voltage Collapse – Case Studies with Dynamic Simulations", IEEE Power Engineering Society General Meeting, 2004, pp. 1806-1812 vol.2.
Abstract: Voltage collapse studies are made to gain an insight into mechanisms that drive a system into collapse. The inter-play of generator controls in local and external areas are explored. Simulations are carried out on a medium sized network by a transient dynamic simulation program. Simulation results help to better understand remediation strategies. The time dependent characteristics of corrective controls are investigated.
Type: Article - Conference proceedings
text
In Title: IEEE Power Engineering Society General Meeting, 2004
Copyright Notice: This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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titleCause and effects of voltage collapse - case studies with dynamic simulations
contributor.authorDong, Feng
contributor.authorCrow, Mariesa L.
contributor.authorChowdhury, Badrul H.
contributor.authorAcar, Levent
contributor.deptlabElectrical and Computer Engineering
contributor.deptlabEnergy Research and Development Center
contributor.deptlabIntelligent Systems Center
contributor.deptlabPower Systems Laboratory
contributor.sponsorNational Science Foundation
subjectload tap changer
subjectover excitation limiter
subjectpreventive control
subjectreactive power margin
subjectstability margin
date.issued2005
publisherInstitute of Electrical and Electronics Engineers IEEE
identifier.citationDong, Feng, Badrul H. Chowdhury, Mariesa L. Crow, and Levent Acar. "Cause and Effects of Voltage Collapse – Case Studies with Dynamic Simulations", IEEE Power Engineering Society General Meeting, 2004, pp. 1806-1812 vol.2.
identifier.pub.URI
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1373191
description.abstractVoltage collapse studies are made to gain an insight into mechanisms that drive a system into collapse. The inter-play of generator controls in local and external areas are explored. Simulations are carried out on a medium sized network by a transient dynamic simulation program. Simulation results help to better understand remediation strategies. The time dependent characteristics of corrective controls are investigated.
typeArticle - Conference proceedings
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rightsallows publisher's final version to be uploaded
rights.URI
http://www.ieee.org/portal/cms_docs_iportals/iportals/publications/rights/downloads/IEEECForm121302pdf.pdf
rights.URI
http://www.ieee.org/web/publications/rights/index.html
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
relation.isPartOfIEEE Power Engineering Society General Meeting, 2004
date.accessioned2008-07-08T18:15:25Z
date.available2008-07-09T16:06:44Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/CauseAndEffectsOfVoltageCollapse-CaseStudiesW_09007dcc8052c9f9.html
Full Text
01373_09007dcc8052ffc7.pdf