Scholars' Mine
Missouri S&T
Research Repository
Curtis Laws Wilson Library
400 W. 14th Street
Rolla, MO 65409-0060
scholarsmine@mst.edu
| Title: | Automatic drift compensation using phase correlation method for nanomanipulation | |
| Author (s): | Yang, Qinmin Sarangapani, Jagannathan Bohannan, Eric W. | |
| Department/Lab Affiliations: | Computer Science Electrical and Computer Engineering Intelligent Systems Center | |
| Keywords: | nanomanipulation neural network (NN) phase correlation method scanning probe microscope thermal drift | |
| Issue Date: | 2008-03 | |
| Publisher: | Institute of Electrical and Electronics Engineers IEEE | |
| Citation: | Q. Yang, S. Jagannathan and E. Bohanan," Automatic drift compensation using phase correlation method for nanomanipulation", IEEE Transactions on Nanotechnology, Vol. 7, no. 2, March 2008, pp. 209-216. | |
| Abstract: | Nanomanipulation and nanofabrication with an atomic force microscope (AFM) or other scanning probe microscope (SPM) are a precursor for nanomanufacturing. It is still a challenging task to accomplish nanomanipulation automatically. In ambient conditions without stringent environmental controls, the task of nanomanipulation requires extensive human intervention to compensate for the spatial uncertainties of the SPM. Among these uncertainties, the thermal drift, which affects spatial resolution, is especially hard to solve because it tends to increase with time, and cannot be compensated simultaneously by feedback from the instrument. In this paper, a novel automatic compensation scheme is introduced to measure and estimate the drift one-step ahead. The scheme can be subsequently utilized to compensate for the thermal drift so that a real-time controller for nanomanipulation can be designed, as if the drift did not exist. Experimental results show that the proposed compensation scheme can predict drift with a small error, and therefore, can be embedded in the controller for manipulation tasks. | |
| Type: | Article - Journal text | |
| In Title: | IEEE Transactions on Nanotechnology | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. allows publisher's final version to be uploaded FULL COPYRIGHT INFORMATION: | |
| Publisher URL: | ||
| Link to this page: | ||
| Full Text: |
|
| title | Automatic drift compensation using phase correlation method for nanomanipulation | |
| contributor.author | Yang, Qinmin | |
| contributor.author | Sarangapani, Jagannathan | |
| contributor.author | Bohannan, Eric W. | |
| contributor.deptlab | Computer Science | |
| contributor.deptlab | Electrical and Computer Engineering | |
| contributor.deptlab | Intelligent Systems Center | |
| subject | nanomanipulation | |
| subject | neural network (NN) | |
| subject | phase correlation method | |
| subject | scanning probe microscope | |
| subject | thermal drift | |
| date.issued | 2008-03 | |
| publisher | Institute of Electrical and Electronics Engineers IEEE | |
| identifier.citation | Q. Yang, S. Jagannathan and E. Bohanan," Automatic drift compensation using phase correlation method for nanomanipulation", IEEE Transactions on Nanotechnology, Vol. 7, no. 2, March 2008, pp. 209-216. | |
| identifier.pub.URI | ||
| description.abstract | Nanomanipulation and nanofabrication with an atomic force microscope (AFM) or other scanning probe microscope (SPM) are a precursor for nanomanufacturing. It is still a challenging task to accomplish nanomanipulation automatically. In ambient conditions without stringent environmental controls, the task of nanomanipulation requires extensive human intervention to compensate for the spatial uncertainties of the SPM. Among these uncertainties, the thermal drift, which affects spatial resolution, is especially hard to solve because it tends to increase with time, and cannot be compensated simultaneously by feedback from the instrument. In this paper, a novel automatic compensation scheme is introduced to measure and estimate the drift one-step ahead. The scheme can be subsequently utilized to compensate for the thermal drift so that a real-time controller for nanomanipulation can be designed, as if the drift did not exist. Experimental results show that the proposed compensation scheme can predict drift with a small error, and therefore, can be embedded in the controller for manipulation tasks. | |
| type | Article - Journal | |
| type.DCMIType | text | |
| type.status | Final version | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights | allows publisher's final version to be uploaded | |
| rights.URI | ||
| rights.URI | ||
| rights.URI | ||
| relation.isPartOf | IEEE Transactions on Nanotechnology | |
| date.accessioned | 2008-07-09T19:55:38Z | |
| date.available | 2008-07-14T20:45:08Z | |
| identifier.persist.URI | ||
| Full Text |
|