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Title: Microwave reflectometry as a novel diagnostic method for detection of skin cancers
Author (s): Chand, K.
Mehta, P.
Beetner, Daryl G.
Zoughi, Reza
Stoecker, W.V.
Department/Lab Affiliations: Applied Microwave Nondestructive Testing Laboratory
Electrical and Computer Engineering
Electromagnetic Compatibility Laboratory
Keywords: basal cell carcinoma
melanoma
microwave reflectometry
relaxation frequency
Issue Date: 2005
Publisher: Institute of Electrical and Electronics Engineers
Citation: Chand, K.; Mehta, P.; Beetner, D.G.; Zoughi, R.; Stoecker, W.V., "Microwave Reflectometry as a Novel Diagnostic Method for Detection of Skin Cancers" IMTC 2005. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 2005. vol.2, no. pp. 1425- 1428, 16-19 May 2005
Abstract: More than one million people are diagnosed with skin cancer each year in the United States and more than ten thousand people die from the disease. Currently, there are some methods for early detection of skin cancers, like visual inspection, but improvements are needed. This paper presents a method involving microwave reflectometry as a diagnostic tool for detection of skin cancers. The results of measurements and simulations for normal and wet skin have been shown to distinguish among skin samples with different properties. Microwave measurements from lesions have also been presented which are used to distinguish between cancerous and benign lesions.
Type: Article - Conference proceedings
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titleMicrowave reflectometry as a novel diagnostic method for detection of skin cancers
contributor.authorChand, K.
contributor.authorMehta, P.
contributor.authorBeetner, Daryl G.
contributor.authorZoughi, Reza
contributor.authorStoecker, W.V.
contributor.deptlabApplied Microwave Nondestructive Testing Laboratory
contributor.deptlabElectrical and Computer Engineering
contributor.deptlabElectromagnetic Compatibility Laboratory
subjectbasal cell carcinoma
subjectmelanoma
subjectmicrowave reflectometry
subjectrelaxation frequency
date.issued2005
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationChand, K.; Mehta, P.; Beetner, D.G.; Zoughi, R.; Stoecker, W.V., "Microwave Reflectometry as a Novel Diagnostic Method for Detection of Skin Cancers" IMTC 2005. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 2005. vol.2, no. pp. 1425- 1428, 16-19 May 2005
identifier.pub.URI
http://ieeexplore.ieee.org/iel5/10678/33711/01604385.pdf?arnumber=160438
description.abstractMore than one million people are diagnosed with skin cancer each year in the United States and more than ten thousand people die from the disease. Currently, there are some methods for early detection of skin cancers, like visual inspection, but improvements are needed. This paper presents a method involving microwave reflectometry as a diagnostic tool for detection of skin cancers. The results of measurements and simulations for normal and wet skin have been shown to distinguish among skin samples with different properties. Microwave measurements from lesions have also been presented which are used to distinguish between cancerous and benign lesions.
typeArticle - Conference proceedings
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T14:26:24Z
date.available2007-04-05T14:26:24Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/01604385_09007dcc8030d97d.html
Full Text
01604385_09007dcc8030d982.pdf