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Title: Near-field intensity correlations in semicontinuous metal films
Author (s): Seal, K.
Noh, H.
Yamilov, Alexey
Cao, H.
Sarchev, A.K.
Genov, D.A.
Shalaev, V.M.
Ying, Z.C.
Department/Lab Affiliations: Physics
Keywords: dielectric thin films
discontinuous metallic thin films
metal concentration
near-field intensity correlations
near-field microscopy
near-field scanning optical microscopy
optical excitations
polaritons
semicontinuous metal-dielectric films
spatial intensity correlation functions
surface plasmons
Issue Date: 2005
Publisher: Institute of Electrical and Electronics Engineers
Citation: Seal, K.; Noh, H.; Yamilov, A.; Cao, H.; Sarchev, A.K.; Genov, D.A.; Shalaev, V.M.; Ying, Z.C. "Near-field intensity correlations in semicontinuous metal films" Quantum Electronics and Laser Science Conference, 2005. QELS '05, 22-27 May 2005 Pages: 1497- 1499 vol. 3
Abstract: Spatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.
Type: Article - Journal
text
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titleNear-field intensity correlations in semicontinuous metal films
contributor.authorSeal, K.
contributor.authorNoh, H.
contributor.authorYamilov, Alexey
contributor.authorCao, H.
contributor.authorSarchev, A.K.
contributor.authorGenov, D.A.
contributor.authorShalaev, V.M.
contributor.authorYing, Z.C.
contributor.deptlabPhysics
subjectdielectric thin films
subjectdiscontinuous metallic thin films
subjectmetal concentration
subjectnear-field intensity correlations
subjectnear-field microscopy
subjectnear-field scanning optical microscopy
subjectoptical excitations
subjectpolaritons
subjectsemicontinuous metal-dielectric films
subjectspatial intensity correlation functions
subjectsurface plasmons
date.issued2005
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationSeal, K.; Noh, H.; Yamilov, A.; Cao, H.; Sarchev, A.K.; Genov, D.A.; Shalaev, V.M.; Ying, Z.C. "Near-field intensity correlations in semicontinuous metal films" Quantum Electronics and Laser Science Conference, 2005. QELS '05, 22-27 May 2005 Pages: 1497- 1499 vol. 3
identifier.pub.URI
http://ieeexplore.ieee.org/iel5/10390/33021/01549185.pdf?arnumber=154918
description.abstractSpatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.
typeArticle - Journal
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T14:25:05Z
date.available2007-04-05T14:25:05Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/01549185_09007dcc8030d7fc.html
Full Text
01549185_09007dcc8030d801.pdf