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| Title: | Estimation of current from near-field measurement | |
| Author (s): | Haixiao Weng Beetner, Daryl G. DuBroff, Richard E. Jin Shi | |
| Department/Lab Affiliations: | Electrical and Computer Engineering Electromagnetic Compatibility Laboratory | |
| Keywords: | EMI analysis chip package chip scale packaging circuit package current estimation electric current electromagnetic interference high frequency chip currents magnetic fields microprocessor chips near-field measurement structural information | |
| Issue Date: | 2005 | |
| Publisher: | Institute of Electrical and Electronics Engineers | |
| Citation: | Haixiao Weng; Beetner, D.G.; DuBroff, R.E.; Jin Shi, "Estimation of current from near-field measurement" EMC 2005. 2005 International Symposium on Electromagnetic Compatibility. pp. 222- 227 Vol. 1, 8-12 Aug. 2005 | |
| Abstract: | Knowledge of high-frequency currents in the chip and chip-package are necessary for EMI analysis and prediction, though measurement of these currents may be difficult to obtain in many cases. One possibility is to estimate currents from near-field scan data. In this paper, measurements were made of the magnetic field over a simple circuit and a chip package. The current flowing in the circuit and the chip lead frame was estimated from the compensated near-field data and compared with measurements made directly on the pins. Estimation was performed both with and without structural information of the lead frame. The susceptibility of estimated currents to measurement errors was analyzed. Results show this technique can be a powerful tool for analyzing high frequency chip currents. | |
| Type: | Article - Conference proceedings text | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. FULL COPYRIGHT INFORMATION: | |
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| title | Estimation of current from near-field measurement | |
| contributor.author | Haixiao Weng | |
| contributor.author | Beetner, Daryl G. | |
| contributor.author | DuBroff, Richard E. | |
| contributor.author | Jin Shi | |
| contributor.deptlab | Electrical and Computer Engineering | |
| contributor.deptlab | Electromagnetic Compatibility Laboratory | |
| subject | EMI analysis | |
| subject | chip package | |
| subject | chip scale packaging | |
| subject | circuit package | |
| subject | current estimation | |
| subject | electric current | |
| subject | electromagnetic interference | |
| subject | high frequency chip currents | |
| subject | magnetic fields | |
| subject | microprocessor chips | |
| subject | near-field measurement | |
| subject | structural information | |
| date.issued | 2005 | |
| date.submitted | 2007 | |
| publisher | Institute of Electrical and Electronics Engineers | |
| identifier.citation | Haixiao Weng; Beetner, D.G.; DuBroff, R.E.; Jin Shi, "Estimation of current from near-field measurement" EMC 2005. 2005 International Symposium on Electromagnetic Compatibility. pp. 222- 227 Vol. 1, 8-12 Aug. 2005 | |
| identifier.pub.URI | ||
| description.abstract | Knowledge of high-frequency currents in the chip and chip-package are necessary for EMI analysis and prediction, though measurement of these currents may be difficult to obtain in many cases. One possibility is to estimate currents from near-field scan data. In this paper, measurements were made of the magnetic field over a simple circuit and a chip package. The current flowing in the circuit and the chip lead frame was estimated from the compensated near-field data and compared with measurements made directly on the pins. Estimation was performed both with and without structural information of the lead frame. The susceptibility of estimated currents to measurement errors was analyzed. Results show this technique can be a powerful tool for analyzing high frequency chip currents. | |
| type | Article - Conference proceedings | |
| type.DCMIType | text | |
| type.status | Final version | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights.URI | ||
| date.accessioned | 2007-04-05T14:24:20Z | |
| date.available | 2007-04-05T14:24:20Z | |
| identifier.persist.URI | ||
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