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| Title: | Analysis of chip-level EMI using near-field magnetic scanning | |
| Author (s): | Dong, X. Deng, S. Hubing, Todd H. Beetner, Daryl G. | |
| Department/Lab Affiliations: | Electrical and Computer Engineering Electromagnetic Compatibility Laboratory | |
| Keywords: | FPGA IC packages chip-level EMI analysis clock driver current distribution electric current measurement electric noise measurement electromagnetic compatibility electromagnetic interference field programmable gate array high-frequency noise currents integrated circuit noise integrated circuit testing integrated circuits magnetic field measurement memory module near-field magnetic scanning printed circuit board radiated emissions radiated energy unintentional radiating structures | |
| Issue Date: | 2004 | |
| Publisher: | Institute of Electrical and Electronics Engineers | |
| Citation: | Dong, X.; Deng, S.; Hubing, T.; Beetner, D., "Analysis of chip-level EMI using near-field magnetic scanning," 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, vol.1, pp. 174- 177, 9-13 Aug. 2004 | |
| Abstract: | Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems. | |
| Type: | Article - Conference proceedings text | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. FULL COPYRIGHT INFORMATION: | |
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| title | Analysis of chip-level EMI using near-field magnetic scanning | |
| contributor.author | Dong, X. | |
| contributor.author | Deng, S. | |
| contributor.author | Hubing, Todd H. | |
| contributor.author | Beetner, Daryl G. | |
| contributor.deptlab | Electrical and Computer Engineering | |
| contributor.deptlab | Electromagnetic Compatibility Laboratory | |
| subject | FPGA | |
| subject | IC packages | |
| subject | chip-level EMI analysis | |
| subject | clock driver | |
| subject | current distribution | |
| subject | electric current measurement | |
| subject | electric noise measurement | |
| subject | electromagnetic compatibility | |
| subject | electromagnetic interference | |
| subject | field programmable gate array | |
| subject | high-frequency noise currents | |
| subject | integrated circuit noise | |
| subject | integrated circuit testing | |
| subject | integrated circuits | |
| subject | magnetic field measurement | |
| subject | memory module | |
| subject | near-field magnetic scanning | |
| subject | printed circuit board | |
| subject | radiated emissions | |
| subject | radiated energy | |
| subject | unintentional radiating structures | |
| date.issued | 2004 | |
| date.submitted | 2007 | |
| publisher | Institute of Electrical and Electronics Engineers | |
| identifier.citation | Dong, X.; Deng, S.; Hubing, T.; Beetner, D., "Analysis of chip-level EMI using near-field magnetic scanning," 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, vol.1, pp. 174- 177, 9-13 Aug. 2004 | |
| identifier.pub.URI | ||
| description.abstract | Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems. | |
| type | Article - Conference proceedings | |
| type.DCMIType | text | |
| type.status | Final version | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights.URI | ||
| date.accessioned | 2007-04-05T14:21:19Z | |
| date.available | 2007-04-05T14:21:19Z | |
| identifier.persist.URI | ||
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