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| Title: | Radiation resistance testing of MOSFET and CMOS as a means of risk management | |
| Author (s): | Tokuhiro, A.T. Bertino, Massimo | |
| Department/Lab Affiliations: | Physics | |
| Keywords: | CMOS CMOS integrated circuits MOSFET MOSFET integrated circuit testing ionizing radiation radiation environment radiation hardening (electronics) radiation resistance testing radiation-induced damage risk management risk management safety factor margins semiconductor device testing test | |
| Issue Date: | 2002 | |
| Publisher: | Institute of Electrical and Electronics Engineers | |
| Citation: | Tokuhiro, A.T.; Bertino, M.F. "Radiation resistance testing of MOSFET and CMOS as a means of risk management" IEEE Transactions on Components and Packaging Technologies [see also Part A: Packaging Technologies, IEEE Transactions on Components, Packaging and Manufacturing Technology], Vol.25, Iss.3, Sep 2002 Pages: 519- 522 | |
| Abstract: | Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible. | |
| Type: | Article - Journal text | |
| Copyright Notice: | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. FULL COPYRIGHT INFORMATION: | |
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| title | Radiation resistance testing of MOSFET and CMOS as a means of risk management | |
| contributor.author | Tokuhiro, A.T. | |
| contributor.author | Bertino, Massimo | |
| contributor.deptlab | Physics | |
| subject | CMOS | |
| subject | CMOS integrated circuits | |
| subject | MOSFET | |
| subject | MOSFET | |
| subject | integrated circuit testing | |
| subject | ionizing radiation | |
| subject | radiation environment | |
| subject | radiation hardening (electronics) | |
| subject | radiation resistance testing | |
| subject | radiation-induced damage | |
| subject | risk management | |
| subject | risk management | |
| subject | safety factor margins | |
| subject | semiconductor device testing | |
| subject | test | |
| date.issued | 2002 | |
| date.submitted | 2007 | |
| publisher | Institute of Electrical and Electronics Engineers | |
| identifier.citation | Tokuhiro, A.T.; Bertino, M.F. "Radiation resistance testing of MOSFET and CMOS as a means of risk management" IEEE Transactions on Components and Packaging Technologies [see also Part A: Packaging Technologies, IEEE Transactions on Components, Packaging and Manufacturing Technology], Vol.25, Iss.3, Sep 2002 Pages: 519- 522 | |
| identifier.issn | 1521-3331 | |
| identifier.pub.URI | ||
| description.abstract | Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible. | |
| type | Article - Journal | |
| type.DCMIType | text | |
| type.status | Final version | |
| rights | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | |
| rights.URI | ||
| date.accessioned | 2007-04-05T14:15:34Z | |
| date.available | 2007-04-05T14:15:34Z | |
| identifier.persist.URI | ||
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