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Title: Large enhancement of spontaneous emission rates of InAs quantum dots in GaAs microdisks
Author (s): Cao, H.
Fang, W.
Xu, J.Y.
Yamilov, Alexey
Ma, Y.
Ho, S.T.
Solomon, G.S.
Department/Lab Affiliations: Physics
Keywords: III-V semiconductors
InAs-GaAs
cavity resonances
embedded in microdisks
emission intensity
indium compounds
inhomogeneous broadening
microcavities
photoluminescence
photoluminescence curves
quantum dots
radiative lifetimes
semiconductor quantum dots
spontaneous emission
spontaneous emission rates enhancement
temporal decay
truncated singular value decomposition
whispering gallery modes
Issue Date: 2002
Publisher: Institute of Electrical and Electronics Engineers
Citation: Cao, H.; Fang, W.; Xu, J.Y.; Yamilov, A.; Ma, Y.; Ho, S.T.; Solomon, G.S. "Large enhancement of spontaneous emission rates of InAs quantum dots in GaAs microdisks" QELS '02. Technical Digest. Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 2002. Pages: 56
Abstract: Control of spontaneous emission in a microcavity has many important applications, e.g. improvement of the efficiency of light emitting devices. InAs quantum dots (QDs) embedded in microdisks are ideal systems for spontaneous emission control. The whispering gallery (WG) modes of microdisks have low volume and high quality factor. The homogeneous linewidth of InAs quantum dots is smaller than the spectral width of WG modes. Thus, a large enhancement of the spontaneous emission rates should be expected for QDs coupled to WG modes. However, large inhomogeneous broadening of the QD energy levels and random spatial distribution of the QDs in a microdisk lead to a broad distribution of the spontaneous emission rates. Using an efficient regularized method based on the truncated singular value decomposition and the non-negative constraints, we extract the distribution of spontaneous emission rates from the temporal decay of emission intensity. The maximum spontaneous emission enhancement factor exceeds 10.
Type: Article - Conference proceedings
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titleLarge enhancement of spontaneous emission rates of InAs quantum dots in GaAs microdisks
contributor.authorCao, H.
contributor.authorFang, W.
contributor.authorXu, J.Y.
contributor.authorYamilov, Alexey
contributor.authorMa, Y.
contributor.authorHo, S.T.
contributor.authorSolomon, G.S.
contributor.deptlabPhysics
subjectIII-V semiconductors
subjectInAs-GaAs
subjectcavity resonances
subjectembedded in microdisks
subjectemission intensity
subjectindium compounds
subjectinhomogeneous broadening
subjectmicrocavities
subjectphotoluminescence
subjectphotoluminescence curves
subjectquantum dots
subjectradiative lifetimes
subjectsemiconductor quantum dots
subjectspontaneous emission
subjectspontaneous emission rates enhancement
subjecttemporal decay
subjecttruncated singular value decomposition
subjectwhispering gallery modes
date.issued2002
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationCao, H.; Fang, W.; Xu, J.Y.; Yamilov, A.; Ma, Y.; Ho, S.T.; Solomon, G.S. "Large enhancement of spontaneous emission rates of InAs quantum dots in GaAs microdisks" QELS '02. Technical Digest. Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 2002. Pages: 56
identifier.pub.URI
http://ieeexplore.ieee.org/iel5/8015/22145/01031087.pdf?arnumber=103108
description.abstractControl of spontaneous emission in a microcavity has many important applications, e.g. improvement of the efficiency of light emitting devices. InAs quantum dots (QDs) embedded in microdisks are ideal systems for spontaneous emission control. The whispering gallery (WG) modes of microdisks have low volume and high quality factor. The homogeneous linewidth of InAs quantum dots is smaller than the spectral width of WG modes. Thus, a large enhancement of the spontaneous emission rates should be expected for QDs coupled to WG modes. However, large inhomogeneous broadening of the QD energy levels and random spatial distribution of the QDs in a microdisk lead to a broad distribution of the spontaneous emission rates. Using an efficient regularized method based on the truncated singular value decomposition and the non-negative constraints, we extract the distribution of spontaneous emission rates from the temporal decay of emission intensity. The maximum spontaneous emission enhancement factor exceeds 10.
typeArticle - Conference proceedings
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T14:14:13Z
date.available2007-04-05T14:14:12Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/01031087_09007dcc8030cb68.html
Full Text
01031087_09007dcc8030cb6d.pdf