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Title: A generalized simulation model for Rayleigh fading channels with accurate second-order statistics
Author (s): Chengshan Xiao
Zheng, Y. Rosa
Department/Lab Affiliations: Electrical and Computer Engineering
Wireless Communications Lab
Keywords: Doppler effect
Rayleigh channels
Rayleigh fading channels
autocorrelation
average fade duration
complex envelope
conditional random Doppler frequency
convergence
correlation methods
cross-correlation
digital simulation
fading envelope
fading phase
generalized simulation model
land mobile radio
level crossing rate
mobile radio channels
probability
probability density functions
quadrature components
random initial phase
random path gain
second-order statistics
simulator
sinusoids
statistical analysis
sum-of-sinusoids statistical simulation model
Issue Date: 2002
Publisher: Institute of Electrical and Electronics Engineers
Citation: Chengshan Xiao; Zheng, Y.R., "A generalized simulation model for Rayleigh fading channels with accurate second-order statistics," IEEE 55th Vehicular Technology Conference, 2002. VTC Spring 2002., vol.1, no. pp. 170- 174 vol.1, 2002
Abstract: A new sum-of-sinusoids statistical simulation model is proposed for Rayleigh fading channels. The new model employs random path gain, random initial phase, and conditional random Doppler frequency for all individual sinusoids. It is shown that the autocorrelations and cross-correlations of the quadrature components, the autocorrelation of the complex envelope of the new simulator match the desired ones exactly even if the number of sinusoids is as small as a single-digit integer Furthermore, the probability density functions of the fading envelope and phase, the level crossing rate and the average fade duration of the new simulator asymptotically approach the desired ones as the number of sinusoids approaches infinity, while good convergence is achieved when the number of sinusoids is small. Statistical properties of the new simulator are evaluated by numerical results, finding good agreement in all cases.
Type: Article - Conference proceedings
text
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titleA generalized simulation model for Rayleigh fading channels with accurate second-order statistics
contributor.authorChengshan Xiao
contributor.authorZheng, Y. Rosa
contributor.deptlabElectrical and Computer Engineering
contributor.deptlabWireless Communications Lab
subjectDoppler effect
subjectRayleigh channels
subjectRayleigh fading channels
subjectautocorrelation
subjectaverage fade duration
subjectcomplex envelope
subjectconditional random Doppler frequency
subjectconvergence
subjectcorrelation methods
subjectcross-correlation
subjectdigital simulation
subjectfading envelope
subjectfading phase
subjectgeneralized simulation model
subjectland mobile radio
subjectlevel crossing rate
subjectmobile radio channels
subjectprobability
subjectprobability density functions
subjectquadrature components
subjectrandom initial phase
subjectrandom path gain
subjectsecond-order statistics
subjectsimulator
subjectsinusoids
subjectstatistical analysis
subjectsum-of-sinusoids statistical simulation model
date.issued2002
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationChengshan Xiao; Zheng, Y.R., "A generalized simulation model for Rayleigh fading channels with accurate second-order statistics," IEEE 55th Vehicular Technology Conference, 2002. VTC Spring 2002., vol.1, no. pp. 170- 174 vol.1, 2002
identifier.pub.URI
http://ieeexplore.ieee.org/iel5/7859/21639/01002686.pdf?arnumber=100268
description.abstractA new sum-of-sinusoids statistical simulation model is proposed for Rayleigh fading channels. The new model employs random path gain, random initial phase, and conditional random Doppler frequency for all individual sinusoids. It is shown that the autocorrelations and cross-correlations of the quadrature components, the autocorrelation of the complex envelope of the new simulator match the desired ones exactly even if the number of sinusoids is as small as a single-digit integer Furthermore, the probability density functions of the fading envelope and phase, the level crossing rate and the average fade duration of the new simulator asymptotically approach the desired ones as the number of sinusoids approaches infinity, while good convergence is achieved when the number of sinusoids is small. Statistical properties of the new simulator are evaluated by numerical results, finding good agreement in all cases.
typeArticle - Conference proceedings
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T14:13:16Z
date.available2007-04-05T14:13:16Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/01002686_09007dcc8030ca9d.html