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Title: The influence of PCl 3 on planarisation and selectivity of InP regrowth by atmospheric pressure MOVPE
Author (s): Harlow, M.J.
Spurdens, P.C.
Moss, Randy Hays
Department/Lab Affiliations: Electrical and Computer Engineering
Image Processing Laboratory
Keywords: AP-MOVPE growth
III-V semiconductors
InP
PCl 3
PCl 3 influence
[100] direction growth suppression
[311] direction growth enhancement
atmospheric pressure MOVPE
dielectric masks
indium compounds
mesa structures
planar regrowth
polycrystalline deposit suppression
regrowth planarisation
regrowth selectivity
scanning electron microscopy
semiconductor growth
surface structure
vapour phase epitaxial growth
Issue Date: 1995
Publisher: Institute of Electrical and Electronics Engineers
Citation: Harlow, M.J.; Spurdens, P.C.; Moss, R.H., "The influence of PCl_3 on planarisation and selectivity of InP regrowth by atmospheric pressure MOVPE," Conference Proceedings. Seventh International Conference on Indium Phosphide and Related Materials, 1995. pp.329-332, 9-13 May 1995
Abstract: The introduction of phosphorus trichloride into the AP-MOVPE growth of InP has been found to dramatically improve the regrowth adjacent to mesa structures. By suppressing growth in the [100] direction and enhancing growth in the [311] directions planar regrowth is achieved. Polycrystalline deposits on dielectric masks can also be completely suppressed
Type: Article - Conference proceedings
text
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titleThe influence of PCl 3 on planarisation and selectivity of InP regrowth by atmospheric pressure MOVPE
contributor.authorHarlow, M.J.
contributor.authorSpurdens, P.C.
contributor.authorMoss, Randy Hays
contributor.deptlabElectrical and Computer Engineering
contributor.deptlabImage Processing Laboratory
subjectAP-MOVPE growth
subjectIII-V semiconductors
subjectInP
subjectPCl 3
subjectPCl 3 influence
subject[100] direction growth suppression
subject[311] direction growth enhancement
subjectatmospheric pressure MOVPE
subjectdielectric masks
subjectindium compounds
subjectmesa structures
subjectplanar regrowth
subjectpolycrystalline deposit suppression
subjectregrowth planarisation
subjectregrowth selectivity
subjectscanning electron microscopy
subjectsemiconductor growth
subjectsurface structure
subjectvapour phase epitaxial growth
date.issued1995
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationHarlow, M.J.; Spurdens, P.C.; Moss, R.H., "The influence of PCl_3 on planarisation and selectivity of InP regrowth by atmospheric pressure MOVPE," Conference Proceedings. Seventh International Conference on Indium Phosphide and Related Materials, 1995. pp.329-332, 9-13 May 1995
identifier.pub.URI
http://ieeexplore.ieee.org/iel3/3908/11338/00522146.pdf?arnumber=52214
description.abstractThe introduction of phosphorus trichloride into the AP-MOVPE growth of InP has been found to dramatically improve the regrowth adjacent to mesa structures. By suppressing growth in the [100] direction and enhancing growth in the [311] directions planar regrowth is achieved. Polycrystalline deposits on dielectric masks can also be completely suppressed
typeArticle - Conference proceedings
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T14:00:35Z
date.available2007-04-05T14:00:34Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/00522146_09007dcc8030be72.html
Full Text
00522146_09007dcc8030be77.pdf