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Title: Data-feedthrough faults in circuits using unclocked storage elements
Author (s): Al-Assadi, Waleed K.
Lu, D.
Jayasumana, A.P.
Malaiya, Y.K.
Tong, C.Q.
Department/Lab Affiliations: Electrical and Computer Engineering
Keywords: CMOS integrated circuits
asynchronous sequential logic
behavioural level
circuit faults
combinational behaviour
combinatorial circuits
data-feedthrough faults
logic testing
semiconductor storage
stuck-at faults
stuck-at-0/1 faults
unclocked storage elements
Issue Date: 1994
Publisher: Institute of Electrical and Electronics Engineers
Citation: Al-Assadi, W.K.; Lu, D.; Jayasumana, A.P.; Malaiya, Y.K.; Tong, C.Q., "Data-feedthrough faults in circuits using unclocked storage elements," Electronics Letters , vol.30, no.10 pp.764-765, 12 May 1994
Abstract: Some faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate
Type: Article - Journal
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titleData-feedthrough faults in circuits using unclocked storage elements
contributor.authorAl-Assadi, Waleed K.
contributor.authorLu, D.
contributor.authorJayasumana, A.P.
contributor.authorMalaiya, Y.K.
contributor.authorTong, C.Q.
contributor.deptlabElectrical and Computer Engineering
subjectCMOS integrated circuits
subjectasynchronous sequential logic
subjectbehavioural level
subjectcircuit faults
subjectcombinational behaviour
subjectcombinatorial circuits
subjectdata-feedthrough faults
subjectlogic testing
subjectsemiconductor storage
subjectstuck-at faults
subjectstuck-at-0/1 faults
subjectunclocked storage elements
date.issued1994
date.submitted2007
publisherInstitute of Electrical and Electronics Engineers
identifier.citationAl-Assadi, W.K.; Lu, D.; Jayasumana, A.P.; Malaiya, Y.K.; Tong, C.Q., "Data-feedthrough faults in circuits using unclocked storage elements," Electronics Letters , vol.30, no.10 pp.764-765, 12 May 1994
identifier.issn0013-5194
identifier.pub.URI
http://ieeexplore.ieee.org/iel1/2220/7191/00289213.pdf?arnumber=28921
description.abstractSome faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate
typeArticle - Journal
type.DCMITypetext
type.statusFinal version
rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
rights.URI
http://www.ieee.org/web/publications/rights/policies.html
date.accessioned2007-04-05T13:57:46Z
date.available2007-04-05T13:57:46Z
identifier.persist.URI
http://scholarsmine.mst.edu/post_prints/00289213_09007dcc8030bbcd.html
Full Text
00289213_09007dcc8030bbd2.pdf