Abstract

We present doubly differential cross sections for single and multiple ionization of the outer shell of neon by 750 eV electron impact. The distinction between single and multiple ionization was achieved by performing a charge state analysis of the recoil ions in coincidence with forward scattered, energy analyzed electrons. By a comparison to photon impact data, the contribution of the second-order double ionization mechanism is estimated and found to be neglible at this impact energy. Following a similar procedure adopted by J. A. R. Samson [Phys. Rev. Lett. 65, 2861 (1990)], the importance of the first-order TS-1 double ionization mechanism is also estimated. As a result it is found that for large energy losses shakeoff is the dominant double ionization mechanism.

Department(s)

Physics

Sponsor(s)

National Science Foundation (U.S.)

Keywords and Phrases

Cross Sections; Electron Impact Ionization; Inelastic Collisions; Photon Energy

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 American Physical Society (APS), All rights reserved.

Included in

Physics Commons

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