Abstract

Spatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.

Meeting Name

2005 Quantum Electronics and Laser Science Conference

Department(s)

Physics

Keywords and Phrases

Dielectric Thin Films; Discontinuous Metallic Thin Films; Metal Concentration; Near-Field Intensity Correlations; Near-Field Microscopy; Near-Field Scanning Optical Microscopy; Optical Excitations; Polaritons; Semicontinuous Metal-Dielectric Films; Spatial Intensity Correlation Functions; Surface Plasmons

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Included in

Physics Commons

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