Diffraction Analysis of HREM Images from a Plasma-Deposited Iron Carbide Film
Bailey, G. W. and Garratt-Reed, A. .J.
The selected area diffraction information in a single high resolution electron microscopy image of iron carbide, plasma-deposited onto a carbon support film at 300 °C was studied. Six areas of the negative that showed cross-fringes were digitized and the interplanar angles of these periodicities were obtained from the respective power spectra. A computer program was then used to measure spacings against all possible indexings for the crystal's various phases. Results indicate that all crystals in the sample region were able to index with spacings for Fe7C3 within 3.5% and 3.5° with no preferred orientation.
H. Siriwardane et al., "Diffraction Analysis of HREM Images from a Plasma-Deposited Iron Carbide Film," Proceedings - Annual Meeting, Microscopy Society of America, Microscopy Society of America, Jan 1994.
Annual Meeting, Microscopy Society of America (1994, New Orleans, LA, USA)
Article - Conference proceedings
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