Role of the Recoil Ion in Single-Electron Capture and Single-Ionization Processes for Collisions of Protons with He and Ar Atoms

Author

P. Focke
Ronald E. Olson, Missouri University of Science and TechnologyFollow
N. D. Cariatore
M. Alessi
S. Otranto

Abstract

In this work the single-electron capture and single-ionization processes are studied for proton collisions with He and Ar atoms at impact energies in the range 25–100 keV. Classical trajectory Monte Carlo simulations are benchmarked against experimental data obtained at the reaction microscope in Bariloche, Argentina, which employs the cold target recoil-ion momentum spectroscopy technique. Special emphasis is placed on describing the momentum transfer to the recoil ion for these collision systems.

Recommended Citation

P. Focke et al., "Role of the Recoil Ion in Single-Electron Capture and Single-Ionization Processes for Collisions of Protons with He and Ar Atoms," Physical Review A, vol. 95, no. 5, American Physical Society (APS), May 2017.

The definitive version is available at https://doi.org/10.1103/PhysRevA.95.052707

Department(s)

Physics

Research Center/Lab(s)

Center for High Performance Computing Research

Comments

Work at Universidad Nacional del Sur is supported by Grants No. PGI 24/F059 and No. PIP 112-201101-00749 of CONICET (Argentina).

Keywords and Phrases

Impact ionization; Intelligent systems; IonizationIons; Monte Carlo methods

International Standard Serial Number (ISSN)

2469-9926; 2469-9934

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2017 American Physical Society (APS), All rights reserved.

Publication Date

01 May 2017