Atomic-Scale Imaging of Aligned Poly-Atomic Molecules with Recollision Electron Diffraction

Author

Michael G. Pullen
Benjamin Wolter
M. Baudisch
M. Hemmer
Arne Senftleben
Claus Dieter Schroeter
Robert Moshammer
Joachim Ullrich
Anh-Thu Le, Missouri University of Science and TechnologyFollow
C. D. Lin
Jens Biegert

Abstract

We present accurate extraction of multiple bond lengths for aligned and antialigned C₂H₂ using recollision electron diffraction.We measure bond lengths of 1:20 ± 0:06 °A (C≡C) and 1:06 ± 0:08 °Å (C-H).

Recommended Citation

M. G. Pullen and B. Wolter and M. Baudisch and M. Hemmer and A. Senftleben and C. D. Schroeter and R. Moshammer and J. Ullrich and A. Le and C. D. Lin and J. Biegert, "Atomic-Scale Imaging of Aligned Poly-Atomic Molecules with Recollision Electron Diffraction," Optics InfoBase Conference Papers, Optical Society of American (OSA), Jul 2014.

Meeting Name

19th International Conference on Ultrafast Phenomena, UP 2014 (2014: Jul. 7-11, Okinawa, Japan)

Department(s)

Physics

Keywords and Phrases

Atomic Scale Imaging; Multiple Bonds; Recollision Electrons, Ultrafast Phenomena

International Standard Book Number (ISBN)

978-155752279-5

International Standard Serial Number (ISSN)

2162-2701

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Optical Society of American (OSA), All rights reserved.

Publication Date

11 Jul 2014