Self-heating effect in intrinsic tunneling spectroscopy of HgBr₂ intercalated Bi₂.₁Sr₁.₄Ca₁.₅Cu ₂O8+δ single crystals

Abstract

We report tunneling results in intrinsic Josephson junction (IJJ) stacks fabricated in the form of square micromesas on HgBr2 intercalated Bi2.1Sr1.4Ca1.5Cu2O 8+δ (Bi2212) single crystals using photolithography and Ar ion milling techniques. Self-heating is the most common problem encountered in interlayer tunneling and it is likely to reduce the reliability of IJJ data. Although intercalation reduces heating a hundredfold, it still needs to be minimized substantially in order to approach the authentic superconducting energy gap observed by tunneling using more conventional junctions. We report tunneling characteristics of two mesas with the same height but different sizes (5 x 5 μm2 and 10 x 10 μm2) to show that heating effects are strongly related to IJJ stack size. For the smaller mesa, we observed an energy gap close to that seen in single SIN (S: superconductor, I: insulator, N: normal metal) and SIS break junctions as well as the dip and hump structures at high bias. The subgap data of 5 x 5 μm2 mesa were successfully fit with a momentum averaged d-wave model using convenient parameters. Thus our data is consistent with the predominant pairing symmetry suggested by point contact tunneling, break junction, scanning tunneling microscopy/spectroscopy and angle resolved photoemission measurements in Bi2Sr2CaCu2O8+δ.

Department(s)

Physics

Second Department

Geosciences and Geological and Petroleum Engineering

Keywords and Phrases

Bismuth compounds; Energy gap; Heating; Intercalation; Josephson junction devices; Mercury compounds; Photolithography; Spectroscopic analysis; Intrinsic josephson junctions; Intrinsic tunneling spectroscopy; Self heating; Single crystals

International Standard Serial Number (ISSN)

1051-8223

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jun 2007

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