Abstract
X-ray photoelectron diffraction (XPD) and low-energy electron diffraction (LEED) have been used to study the structural properties of V thin films on Cu(001). For room-temperature growth, submonolayer coverages result in (1x1) LEED patterns that evolve to exhibit very diffuse (2x1) structure at approximately 1 monolayer coverage. We do not observe any V forward-focusing enhancements for V films that exhibit either the (1x1) or (2x1) structure, suggesting that these structures are limited to the first 1-2 vanadium layers. At coverages above 1 monolayer, the V films display complex LEED patterns characteristic of four bcc(110) domains. This structure persists to V coverages as high as 100 ML, and the LEED and XPD angular scans suggest that V in these films retain the bulk V lattice constant. These results have important ramifications for predictions of magnetic order in vanadium thin films that typically assume pseudomorphic growth.
Recommended Citation
G. D. Waddill et al., "Photoelectron Diffraction Determination of the Structure of Ultrathin Vanadium Films on Cu(001)," Physical Review B (Condensed Matter), vol. 61, no. 11, pp. 7301 - 7304, American Physical Society (APS), Mar 2000.
The definitive version is available at https://doi.org/10.1103/PhysRevB.61.7301
Department(s)
Physics
International Standard Serial Number (ISSN)
0163-1829
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2000 American Physical Society (APS), All rights reserved.
Publication Date
01 Mar 2000
