Photoelectron Spectroscopy of U Oxide at LLNL

Abstract

X-ray photoelectron spectroscopy has been used to characterize a sample of UO 2 grown on an underlying substrate of Uranium. Both AlKα (1487 eV) and MgKα (1254 eV) emission were utilized as the excitation.

Meeting Name

MRS Spring Meeting (2010: Apr. 5-9, San Francisco, CA)

Department(s)

Physics

Keywords and Phrases

Electrons; Photoelectricity; Photons; Uranium; X ray photoelectron spectroscopy; Oxide

International Standard Book Number (ISBN)

978-1605112411

International Standard Serial Number (ISSN)

0272-9172

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Materials Research Society (MRS), All rights reserved.

Publication Date

01 Apr 2010

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