Abstract

Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible.

Department(s)

Mining and Nuclear Engineering

Second Department

Physics

Keywords and Phrases

CMOS; CMOS Integrated Circuits; MOSFET; Integrated Circuit Testing; Ionizing Radiation; Radiation Environment; Radiation Hardening (Electronics); Radiation Resistance Testing; Radiation-Induced Damage; Risk Management; Safety Factor Margins; Semiconductor Device Testing; Test

International Standard Serial Number (ISSN)

1521-3331

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2002 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Full Text Link

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Physics Commons

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