Title

Surface Enhanced Raman Scattering Silica Substrate Fast Fabrication by Femtosecond Laser Pulses

Abstract

We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5×106, evaluated by Rhodamine 6G (10−7 M solution), was obtained. The Raman mapping indicated a good uniformity over the fs-laser scanned area. The dimension and pattern of the SERS activated region can be conveniently controlled by laser 2D scanning, potentially enabling integration of SERS into a high-order optical-chemical analysis system on a glass chip.

Department(s)

Mechanical and Aerospace Engineering

Second Department

Electrical and Computer Engineering

Sponsor(s)

United States. Office of Naval Research
University of Missouri Research Board

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Springer Verlag, All rights reserved.


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