Surface Enhanced Raman Scattering Silica Substrate Fast Fabrication by Femtosecond Laser Pulses
Abstract
We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5×106, evaluated by Rhodamine 6G (10−7 M solution), was obtained. The Raman mapping indicated a good uniformity over the fs-laser scanned area. The dimension and pattern of the SERS activated region can be conveniently controlled by laser 2D scanning, potentially enabling integration of SERS into a high-order optical-chemical analysis system on a glass chip.
Recommended Citation
Y. Han et al., "Surface Enhanced Raman Scattering Silica Substrate Fast Fabrication by Femtosecond Laser Pulses," Applied Physics A: Materials Science and Processing, Springer Verlag, Nov 2009.
The definitive version is available at https://doi.org/10.1007/s00339-009-5306-z
Department(s)
Mechanical and Aerospace Engineering
Second Department
Electrical and Computer Engineering
Sponsor(s)
United States. Office of Naval Research
University of Missouri Research Board
International Standard Serial Number (ISSN)
0947-8396
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Springer Verlag, All rights reserved.
Publication Date
01 Nov 2009
