Surface Enhanced Raman Scattering Silica Substrate Fast Fabrication by Femtosecond Laser Pulses
We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5×106, evaluated by Rhodamine 6G (10−7 M solution), was obtained. The Raman mapping indicated a good uniformity over the fs-laser scanned area. The dimension and pattern of the SERS activated region can be conveniently controlled by laser 2D scanning, potentially enabling integration of SERS into a high-order optical-chemical analysis system on a glass chip.
Y. Han et al., "Surface Enhanced Raman Scattering Silica Substrate Fast Fabrication by Femtosecond Laser Pulses," Applied Physics A: Materials Science and Processing, Springer Verlag, Nov 2009.
The definitive version is available at http://dx.doi.org/10.1007/s00339-009-5306-z
Mechanical and Aerospace Engineering
Electrical and Computer Engineering
United States. Office of Naval Research
University of Missouri Research Board
Article - Journal
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