Process and Local Layout Effect Interaction on a High Performance Planar 20nm CMOS
As technology has advanced, layout dependent device parameter shifts are becoming more influential to the actual circuit operation and performance, such that design style differences could create systematic device variability due to layout unless those effect are minimized and well captured in the device model. In this paper, we characterize the device layout effects on a high performance planar 20nm CMOS technology for low power mobile applications , and demonstrate a layout effect reduction by optimizing key process elements while improving device performance. Nfet/pfet boundary proximity in Replacement Metal Gate (RMG), Length of active area (LOD or SA/SB) and gate pitch dependency are discussed in terms of Stress Memorization Technique (SMT) and embedded SiGe (eSiGe) processes. © 2013 JSAP.
F. Sato and R. Ramachandran and H. Van Meer and K. H. Cho and A. Ozbek and X. Yang and Y. Liu and Z. Li and X. Wu and S. Jain and H. Utomo, "Process and Local Layout Effect Interaction on a High Performance Planar 20nm CMOS," IEEE Symposium on VLSI Circuits, Digest of Technical Papers, Institute of Electrical and Electronics Engineers (IEEE), Jan 2013.
2013 Symposium on VLSI Circuits, VLSIC 2013
Mechanical and Aerospace Engineering
The Japan Society of Applied Physics
The IEEE Solid-State Circuits Society
Article - Conference proceedings
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
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