Abstract

Two-dimensional (2D) material of silicon phosphide (SiP) has recently been shown as a promising optical material with large band gap, fast photoresponse and strong anisotropy. However, the nonlinear optical properties of 2D SiP have not been investigated yet. Here, the thickness-dependent in-plane anisotropic third-harmonic generation (THG) from the mechanically exfoliated 2D layered SiP flakes is reported. The crystal orientation of the SiP flake is determined by the angle-resolved polarized Raman spectroscopy. The angular dependence of the THG emission with respect to the incident linear polarization is found to be strongly anisotropic with the two-fold polarization dependence pattern. Furthermore, the effect of the SiP flake thickness on the THG power is analyzed.

Department(s)

Mechanical and Aerospace Engineering

Research Center/Lab(s)

Intelligent Systems Center

Comments

National Science Foundation, Grant 1552871

International Standard Serial Number (ISSN)

2045-2322

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2021 The Authors, All rights reserved.

Publication Date

01 Dec 2021

PubMed ID

33737690

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