Abstract

A particle simulation based source model is developed to calculate the density distribution of the sputtered Mo atoms for a whole ion optics grid. The source model is used in PIC simulation of ion thruster plume contamination for 3-grid and 2-grid ion thrusters. The results show that the commonly used point-source approximation for sputtered Mo atoms is oversimplified and would lead to over-prediction of contamination deposition.

Meeting Name

49th AIAA/ASME/SAE/ASEE Joint Propulsion Conference (2013: Jul. 14-17, San Jose, CA)

Department(s)

Mechanical and Aerospace Engineering

Keywords and Phrases

A-particles; Density distributions; Ion Optics; Ion thruster; PIC simulation; Point-sources; Source modeling; Ion propulsion; Computer simulation

International Standard Book Number (ISBN)

978-1-62410-222-6

Document Type

Article - Conference proceedings

Document Version

Accepted Manuscript

File Type

text

Language(s)

English

Rights

© 2013 American Institute of Aeronautics and Astronautics (AIAA), All rights reserved.

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