A particle simulation based source model is developed to calculate the density distribution of the sputtered Mo atoms for a whole ion optics grid. The source model is used in PIC simulation of ion thruster plume contamination for 3-grid and 2-grid ion thrusters. The results show that the commonly used point-source approximation for sputtered Mo atoms is oversimplified and would lead to over-prediction of contamination deposition.
D. F. Han and J. J. Wang, "Simulations of Ion Thruster Plume Contamination with a Whole Grid Sputtered Mo Source Model," Proceedings of the 49th AIAA/ASME/SAE/ASEE Joint Propulsion Conference (2013, San Jose, CA), American Institute of Aeronautics and Astronautics (AIAA), Jul 2013.
The definitive version is available at http://dx.doi.org/10.2514/6.2013-3888
49th AIAA/ASME/SAE/ASEE Joint Propulsion Conference (2013: Jul. 14-17, San Jose, CA)
Mechanical and Aerospace Engineering
Keywords and Phrases
A-particles; Density distributions; Ion Optics; Ion thruster; PIC simulation; Point-sources; Source modeling; Ion propulsion; Computer simulation
International Standard Book Number (ISBN)
Article - Conference proceedings
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