Abstract

We have evaluated lanthanum strontium cobalt oxide (La0.50Sr0.50CoOx; LSCO 50/50) as a candidate “transparent” electrode for use in an electrostatic shutter-based infrared sensor protection device. The device requires that the electrode be transparent (80% transmission) and have moderate sheet resistance (300 - 500 Ω/sq.). To meet these needs, the effects of postdeposition annealing on the resistivity and optical absorption characteristics of sputter deposited LSCO thin films were studied. The as-deposited films were characterized by an absorption coefficient of ~ 12,500 cm-1 and resistivities of ~ 0.08 to 0.5 Ω-cm. With annealing at 800°C, the resistivity decreased to 350 μΩ-cm, while the absorption coefficient increased to ~ 155,000 cm-1. By using a post-deposition annealing step at 800°C and controlling film thickness, it appears that a standard LSCO 50/50 material may possess the requisite conductivity and optical transmission properties for this sensor protection device.

Department(s)

Mechanical and Aerospace Engineering

Sponsor(s)

United States. Defense Advanced Research Projects Agency
United States. Department of Energy

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2000 Materials Research Society, All rights reserved.

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