Total Internal Reflection Effects on Two-Dimensional Scattering Measurements

Author

Dwight C. Look, Missouri University of Science and TechnologyFollow
Harlan F. Nelson, Missouri University of Science and TechnologyFollow

Abstract

A simple geometric optics explanation is given for various total internal reflection anomalies which were obtained during the acquisition of experimental two-dimensional scattering data. This explanation appears accurately to indicate where the effects of the total internal reflection appear in the data but not the magnitude of the effect.

Recommended Citation

D. C. Look and H. F. Nelson, "Total Internal Reflection Effects on Two-Dimensional Scattering Measurements," Optics & Laser Technology, Elsevier, Jan 1988.

The definitive version is available at https://doi.org/10.1016/0030-3992(88)90098-9

Department(s)

Mechanical and Aerospace Engineering

Keywords and Phrases

Total Internal Reflection; Two-Dimensional Scattering; Diffusely Reflecting Substrate

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1988 Elsevier, All rights reserved.

Publication Date

01 Jan 1988