Alternative Title

An angular-resolved XAFS study

Abstract

We present results from angular-resolved x-ray-absorption fine-structure (XAFS) measurements at the Ni, La, and Sr K edges of oriented powders of La1.85Sr0.15Cu1-yNiyO4, with y=0.01, 0.03, 0.06. A special magnetic alignment procedure allowed us to measure pure ĉ- and ab-oriented XAFS at the Ni K edge in identical fluorescence geometries. Both the x-ray-absorption near-edge structure and the XAFS unequivocally show that the NiO6 octahedra are contracted along the c axis by ≈0.32Å relative to CuO6 octahedra while the in-plane distances of NiO6 and CuO6 octahedra are the same within 0.01Å. The NiO6 octahedral contraction drives the average ĉ axis contraction measured by diffraction with increasing content of Ni. The local ĉ axis shows strong spatial fluctuations, due to the different NiO6 and CuO6 octahedral configurations and the stronger bonding of a La3+ ion than a Sr2+ ion to the O(2) apical oxygens of such octahedra. We discuss the relevance of these findings to the mechanisms of loss of superconductivity at y≈0.03 and hole localization above y≈0.05 by Ni dopants.

Department(s)

Materials Science and Engineering

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2001 American Physical Society (APS), All rights reserved.

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