Title

Microstructural Characterization of Sputter Deposited BaTiO₃/Ni/BaTiO₃/Ni/BaTiO₃ Multi-Layer Thin Films on SiO₂/Si Wafers

Meeting Name

Microscopy and Microanalysis 2009 (2009: Jul. 26-30, Richmond, VA)

Department(s)

Materials Science and Engineering

International Standard Serial Number (ISSN)

1431-9276; 1435-8115

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Cambridge University Press , All rights reserved.

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