High Energy Density Dielectrics For Symmetric Blumleins
Multilayer, tape cast ceramics are being developed for use in large area, high voltage devices in order to achieve high specific energy densities (>106 J/m3) and physical size reduction. In particular, symmetric Blumleins are desired with the following properties:
- High voltage hold off (≥300 kV)
- High, nondispersive permittivity: ≈100 to 900
- Ability to be fabricated into various shapes and sizes
- Surface flashover inhibition at the edge
- Ability to be triggered by surface flashover switching
The compositions being pursued are based on pure BaTiO3 dielectrics. Our approach is to add glass phase additions which result in not only near theoretical densities, but also allow for fabrication of more complex geometries through high temperature creep. Variations in the volume fraction and connectivity of the glassy phase allow for direct control of the permittivity as well as energy density. Structures up to 5 inches in diameter have been fabricated and pulse-tested at field strengths over 300 kV/cm. A strong dependence of breakdown strength and permittivity has been observed and correlated with microstructure and the glass composition. This paper presents the interactive effects of manipulation of these variables.
W. Huebner and S. C. Zhang, "High Energy Density Dielectrics For Symmetric Blumleins," Proceedings of the 12th IEEE International Symposium on Applications of Ferroelectrics (2000, Honolulu, HI), vol. 2, pp. 833-836, Institute of Electrical and Electronics Engineers Inc. (IEEE), Jul 2000.
The definitive version is available at http://dx.doi.org/10.1109/ISAF.2000.942447
12th IEEE International Symposium on Applications of Ferroelectrics (2000: Jul. 21-Aug. 2, Honolulu, HI)
Materials Science and Engineering
Keywords and Phrases
Barium titanate; Ceramic materials; Composition; Creep; Crystal microstructure; Flashover; High temperature effects; Multilayers; Permittivity; High energy density dielectrics; Surface flashover inhibition; Symmetric Blumleins; Voltage failure; Dielectric materials
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2000 Institute of Electrical and Electronics Engineers Inc. (IEEE), All rights reserved.