Title

Minimization of Field Enhancement in Multilayer Capacitors

Abstract

Evidence has shown that capacitor failure can often be attributed to field enhancement that occurs near electrode tips. In this research, methods to minimize field enhancement have been investigated using a combination of finite element analysis and an evolutionary algorithm. Specifically, the two methods considered are (1) to modify the electrode structure and (2) to adjust the resistivity in the dielectric region surrounding the tip. Optimal electrode structures and resistivity profiles have been derived that result in a significant reduction of field enhancement. Interestingly, it is predicted that adjustment of resistivity can yield a much greater reduction with a relatively minor increase in conduction loss.

Department(s)

Materials Science and Engineering

Keywords and Phrases

Dielectric materials; Electric fields; Electrodes; Finite element method; Multilayers; Optimization; Dielectric breakdown; Dielectric region; Field enhancement; Capacitors

International Standard Serial Number (ISSN)

9270256

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2006 Elsevier, All rights reserved.

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