Processing and Dielectric Properties of TiO₂ Thick Films for High-energy Density Capacitor Applications
Abstract
Nanosized titanium dioxide (TiO2) powders (∼40 nm) were used for preparation of tape-casting slurries. Effect of various solvents and dispersants on the dispersability of TiO2 slurries was studied by sedimentation tests and rheology measurements. TiO2 green tapes were prepared by tape-casting method and densified at 1000°C with a sintered density >95%. Dielectric properties of TiO2 tapes were studied by measuring of dielectric constant, loss factor and dielectric breakdown strength (BDS) with respect to their microstructural development. BDS values as high as ∼1400 kV/cm were obtained for sintered tapes so that energy densities up to 14 J/cm3 could be achieved.
Recommended Citation
S. Chao and F. Dogan, "Processing and Dielectric Properties of TiO₂ Thick Films for High-energy Density Capacitor Applications," International Journal of Applied Ceramic Technology, Wiley-Blackwell, Nov 2011.
The definitive version is available at https://doi.org/10.1111/j.1744-7402.2010.02592.x
Department(s)
Materials Science and Engineering
International Standard Serial Number (ISSN)
1546-542X
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2011 Wiley-Blackwell, All rights reserved.
Publication Date
01 Nov 2011
