Abstract

Total ionizing dose (TID) and single event effects testing was performed on Altera Cyclone FPGAs. The devices exhibit slight performance degradation to a TID of 1 Mrad (Si), but also exhibited single event latchup at a low LET.

Department(s)

Mathematics and Statistics

Keywords and Phrases

1 Mrad; FPGA; SEE Testing; SEL; SEU; TID; Field Programmable Gate Arrays; Integrated Circuit Reliability; Integrated Circuit Testing; Low LET Single Event Latchup; Performance Degradation; Radiation Effects; Single Event Effects; Total Ionizing Dose

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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