Keywords and Phrases
EMC; EMI; Optical tracking
"The objectives of this research are to visualize the frequency dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the radiating source reconstruction on complex shaped electronic systems. This is achieved by combining near field probing with a system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved manually not robotically. Concurrently, the local near field will be recorded, associated with the location and displayed at near real time on the captured 3D geometry as a field strength map for EMC applications and, for source reconstruction, a reconstructed image showing the far field radiating sources."--Abstract, page iii.
Fan, Jun, 1971-
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
xii, 111 pages
© 2015 Hui He, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Near-fields -- Measurement
Electronic OCLC #
He, Hui, "The development of near field probing systems for EMC near field visualization and EMI source localization" (2015). Masters Theses. 7435.