DLTS measurements of interface states in SOS devices and thermal annealing effect after gamma and neutron irradiations
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
vii, 60 pages
© 1988 Jenn-Mou Sun, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b2140328~S5
Sun, Jenn-Mou, "DLTS measurements of interface states in SOS devices and thermal annealing effect after gamma and neutron irradiations" (1988). Masters Theses. 698.
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