Masters Theses

Title

DLTS measurements of interface states in SOS devices and thermal annealing effect after gamma and neutron irradiations

Author

Jenn-Mou Sun

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Fall 1988

Pagination

vii, 60 pages

Rights

© 1988 Jenn-Mou Sun, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Thesis Number

T 5786

Print OCLC #

19473148

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b2140328~S5

This document is currently not available here.

Share My Thesis If you are the author of this work and would like to grant permission to make it openly accessible to all, please click the button above.

Share

 
COinS