Defect tolerance and testing for configurable nano crossbars
Keywords and Phrases
"Moore's Law speculated a trend in computation technology in terms of number of transistors per unit area that would double roughly every two years. Even after 40 years of this prediction, current technologies have been following it successfully. There are however, certain physical limitations of current CMOS that would result in fundamental obstructions to continuation of Moore's Law. Although there is a debate amongst experts on how much time it would take for this to happen, it is certain that some entirely new paradigms for semiconductor electronics would be needed to replace CMOS and to delay the end of Moore's Law. Silicon nanowires (SiNW) and Carbon nanotubes (CNT) possess significant promise to replace current CMOS"--Abstract, page iv.
Al-Assadi, Waleed K.
McCracken, Theodore E.
Smith, Scott C.
Electrical and Computer Engineering
M.S. in Computer Engineering
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- BIST approach for configurable nanofabric arrays
- Nanofabric PLA architecture with redundancy enhancement
ix, 41 pages
© 2008 Mandar Vijay Joshi, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Integrated circuits -- Fault tolerance
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b6489334~S5
Joshi, Mandar V., "Defect-tolerance and testing for configurable nano-crossbars" (2008). Masters Theses. 6775.