Characterization of near field probes and IC transient current prediction and PDN noise estimation
"In near-field it is important to find the affected net or IC. Selecting the right loop probe when scanning circuit boards for magnetic field susceptibility is a trade-off between the sensitivity and the spatial resolution. In this paper, multi-turn loop inductor was applied as near-field probe, which can partially overcome. The multi-turn inductors are commercially available in small sizes and large inductance. The limitations of the SMT inductors probe were also investigated"--Abstract, leaf iii.
Beetner, Daryl G.
Drewniak, James L.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
x, 79 leaves
© 2008 Tun Li, All rights reserved.
Thesis - Citation
Library of Congress Subject Headings
Electronic circuits -- Noise
Printed circuits -- Design and construction
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b6595956~S5
Li, Tun, "Characterization of near field probes and IC transient current prediction and PDN noise estimation" (2008). Masters Theses. 63.