Masters Theses

Title

Universal electric and magnetic fields analyzer system

Author

Yong Cheh Ho

Abstract

"Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and widerange phase-shifting. The complete universal field analyzer would consist of the probe and the electronics system. This thesis would focus on the realization of the electronics system"--Abstract, leaf iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

Beetner, Daryl G.
Jun, Fan
DuBroff, Richard E.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Spring 2008

Pagination

x, 56 leaves

Note about bibliography

Includes bibliographical references (leaf 46).

Rights

© 2008 Yong cheh Ho, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Library of Congress Subject Headings

Electromagnetic measurements
Integrated circuits -- Design
Near-fields -- Measurement

Thesis Number

T 9383

Print OCLC #

272356925

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b6527606~S5

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