"Electrostatic Discharge (ESD) can disrupt the performance of an electronic system, like an MP3 player either by injected currents or by transient fields. It is possible to predict at least the approximate transient field levels inside a system, but it is difficult to determine the response of ICs subjected to these fields, as no IC specific data is available, and as it is often too involved to measure the sensitivity of every IC possibly used in a product. As deterministic solutions are difficult to achieve, a statistical approach has been selected in this research. The goal of this database for field coupled ESD (Electrostatic Discharge) sensitivity is to give guidance on estimating if soft-error (e.g., resets) problems are likely to occur, for a given ESD scenario. Electric field probes, magnetic field probes, and the ΣΔ probe, which can inject either electrical fields or magnetic fields as desired, are designed as field injection devices for the project. A TEM cell and an IC-stripline, which are designed for high voltage immunity testing, are also developed as injection methods for the purpose of the IC measurements for this database. The measurement setups for the off-shelf electronic products using the probes are shown. Further detailing parameter dependence, a 1.2 mm spacer and a 100 MHz low pass were inserted into the test setups. Observing the crash levels of the ICs under varying conditions allows better insight into the mechanism and the robustness of the database with respect to uncertainties introduced by the field injection methods and their calibrations. In the end, the data from 37 real ICs are analyzed and discussed, and the examples of applications for the database are also discussed"--Abstract, page iii.
Fan, Jun, 1971-
Electrical and Computer Engineering
M.S. in Electrical Engineering
Samsung Electronics Ltd.
Missouri University of Science and Technology
xii, 101 pages
© 2012 Zhen Li, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Electric discharges -- Prevention
Integrated circuits -- Defects
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b9390219~S5
Li, Zhen, "Field coupled electrostatic discharge sensitivity database" (2012). Masters Theses. 5142.