Masters Theses

Author

Zhen Li

Abstract

"Electrostatic Discharge (ESD) can disrupt the performance of an electronic system, like an MP3 player either by injected currents or by transient fields. It is possible to predict at least the approximate transient field levels inside a system, but it is difficult to determine the response of ICs subjected to these fields, as no IC specific data is available, and as it is often too involved to measure the sensitivity of every IC possibly used in a product. As deterministic solutions are difficult to achieve, a statistical approach has been selected in this research. The goal of this database for field coupled ESD (Electrostatic Discharge) sensitivity is to give guidance on estimating if soft-error (e.g., resets) problems are likely to occur, for a given ESD scenario. Electric field probes, magnetic field probes, and the ΣΔ probe, which can inject either electrical fields or magnetic fields as desired, are designed as field injection devices for the project. A TEM cell and an IC-stripline, which are designed for high voltage immunity testing, are also developed as injection methods for the purpose of the IC measurements for this database. The measurement setups for the off-shelf electronic products using the probes are shown. Further detailing parameter dependence, a 1.2 mm spacer and a 100 MHz low pass were inserted into the test setups. Observing the crash levels of the ICs under varying conditions allows better insight into the mechanism and the robustness of the database with respect to uncertainties introduced by the field injection methods and their calibrations. In the end, the data from 37 real ICs are analyzed and discussed, and the examples of applications for the database are also discussed"--Abstract, page iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

Fan, Jun, 1971-
Zhang, Yaojiang

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Sponsor(s)

Samsung Electronics Ltd.

Publisher

Missouri University of Science and Technology

Publication Date

Spring 2012

Pagination

xii, 101 pages

Note about bibliography

Includes bibliographical references (leaves 39-41).

Rights

© 2012 Zhen Li, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Library of Congress Subject Headings

Electric discharges -- Prevention
Electrostatics
Integrated circuits -- Defects

Thesis Number

T 9971

Print OCLC #

815959083

Electronic OCLC #

783791250

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