Degradations of MOSFETs from high temperature, radiation and hot electron effects
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
vii, 81 pages
© 1987 Cheng-Fuh Jeffrey Tang, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b1958033~S5
Tang, Cheng-Fuh Jeffrey, "Degradations of MOSFETs from high temperature, radiation and hot electron effects" (1987). Masters Theses. 497.
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